Table of Contents
Advertisement
Appendix A. SystemGuard Test Groups
SystemGuard Test Groups Table
The following diagram shows the various test groups and their associated tests. To modify
the test list, the tests have to be selected in the xxyy format, where xx is the group number
and yy is the test number within the group. For example, enter 0106 to specify the NVRAM
test in the BUMP Quick IO test group.
GROUP NO
01
02
03
04
GROUP
TEST NO
BUMP quick IO test
group
JTAG test group
Direct IO test group
CPU test group
TEST
01
Debug Line Test
02
S1 ASL (BUMP) Test
03
S2 ASL (REM.) Test
04
S3 ASL (SPE.) Test
05
Flash EPROM Content Test
06
NVRAM Content Test
07
Eprom Content Test
08
TOD Test
09
Floppy Disk controller Test
10
BPP Registers Test
11
Misc. register Test
12
CPU access Test
13
VPD Coherency Test
50
Asynch. lines L–B Test (*)
51
BPP Ext. L–B Full Test (**)
52
Printer Test
53
Dial–Out Test
54
BPP Ext. L–B Test (*)
01
JTAG Chain Integrity Test
01
IONIAN – SSGA reg. Test
02
NVRAM access Test
03
Super–IO access Test
04
Flash access Test
05
Eprom access Test
06
TOD access Test
07
IONIAN2 Regs. Test
50
Floppy Disk Ext. Test
01
CPU processor Test
02
Address translation Test
03
L1 cache Test
04
L2 cache Test
05
EEPROM coherency Test
SystemGuard Test Groups
A-1
Advertisement
Table of Contents
